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Effect of Au-Coating on the Laser Spot Cutting on Spring Contact Probe (SCP) for Semi-Conductor Inspection
Spring contact probes (SCPs) are used to make contact with various test points on printed circuit boards (PCBs), wire harnesses, and connectors. Moreover, they can consist of the test interface between the PCBs and the semiconductor devices. For mass production of SCPs, ultra-small precision compone...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8232112/ https://www.ncbi.nlm.nih.gov/pubmed/34203677 http://dx.doi.org/10.3390/ma14123300 |