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An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array
As one of the most promising embedded non-volatile storage solutions for advanced CMOS modules, resistive random access memory’s (RRAM) applications depend highly on its cyclability. Through detailed analysis, links have been found between noise types, filament configurations and the occurrence of r...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer US
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8257814/ https://www.ncbi.nlm.nih.gov/pubmed/34224012 http://dx.doi.org/10.1186/s11671-021-03569-0 |