Accurate prediction of mega-electron-volt electron beam properties from UED using machine learning

To harness the full potential of the ultrafast electron diffraction (UED) and microscopy (UEM), we must know accurately the electron beam properties, such as emittance, energy spread, spatial-pointing jitter, and shot-to-shot energy fluctuation. Owing to the inherent fluctuations in UED/UEM instrume...

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Detalles Bibliográficos
Autores principales: Zhang, Zhe, Yang, Xi, Huang, Xiaobiao, Li, Junjie, Shaftan, Timur, Smaluk, Victor, Song, Minghao, Wan, Weishi, Wu, Lijun, Zhu, Yimei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8260651/
https://www.ncbi.nlm.nih.gov/pubmed/34230561
http://dx.doi.org/10.1038/s41598-021-93341-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8260651/
https://www.ncbi.nlm.nih.gov/pubmed/34230561
http://dx.doi.org/10.1038/s41598-021-93341-2

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