Anomaly Detection and Automatic Labeling for Solar Cell Quality Inspection Based on Generative Adversarial Network

Quality inspection applications in industry are required to move towards a zero-defect manufacturing scenario, with non-destructive inspection and traceability of 100% of produced parts. Developing robust fault detection and classification models from the start-up of the lines is challenging due to...

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Detalles Bibliográficos
Autores principales: Balzategui, Julen, Eciolaza, Luka, Maestro-Watson, Daniel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8271990/
https://www.ncbi.nlm.nih.gov/pubmed/34202285
http://dx.doi.org/10.3390/s21134361

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8271990/
https://www.ncbi.nlm.nih.gov/pubmed/34202285
http://dx.doi.org/10.3390/s21134361

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