Non-topographic current contrast in scanning field emission microscopy

In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R. Soc. A 472, 20160475. (doi:10.1098/rspa.2016.0475)), the fie...

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Detalles Bibliográficos
Autores principales: Bertolini, G., Gürlü, O., Pröbsting, R., Westholm, D., Wei, J., Ramsperger, U., Zanin, D. A., Cabrera, H., Pescia, D., Xanthakis, J. P., Schnedler, M., Dunin-Borkowski, R. E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society 2021
Materias:
Physics and Biophysics
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8278050/
https://www.ncbi.nlm.nih.gov/pubmed/34295530
http://dx.doi.org/10.1098/rsos.210511

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8278050/
https://www.ncbi.nlm.nih.gov/pubmed/34295530
http://dx.doi.org/10.1098/rsos.210511

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