Correlating the electronic structures of metallic/semiconducting MoTe(2) interface to its atomic structures

Contact interface properties are important in determining the performances of devices that are based on atomically thin two-dimensional (2D) materials, especially for those with short channels. Understanding the contact interface is therefore important to design better devices. Herein, we use scanni...

Descripción completa

Detalles Bibliográficos
Autores principales: Han, Bo, Yang, Chen, Xu, Xiaolong, Li, Yuehui, Shi, Ruochen, Liu, Kaihui, Wang, Haicheng, Ye, Yu, Lu, Jing, Yu, Dapeng, Gao, Peng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2020
Materias:
Materials Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8288393/
https://www.ncbi.nlm.nih.gov/pubmed/34691565
http://dx.doi.org/10.1093/nsr/nwaa087

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8288393/
https://www.ncbi.nlm.nih.gov/pubmed/34691565
http://dx.doi.org/10.1093/nsr/nwaa087

Ejemplares similares