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Correlating the electronic structures of metallic/semiconducting MoTe(2) interface to its atomic structures
Contact interface properties are important in determining the performances of devices that are based on atomically thin two-dimensional (2D) materials, especially for those with short channels. Understanding the contact interface is therefore important to design better devices. Herein, we use scanni...
| Autores principales: | , , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Oxford University Press
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8288393/ https://www.ncbi.nlm.nih.gov/pubmed/34691565 http://dx.doi.org/10.1093/nsr/nwaa087 |