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Transparent Memory Tests Based on the Double Address Sequences

An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and networks on chips, on-board computer applications, net...

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Detalles Bibliográficos
Autores principales: Mrozek, Ireneusz, Yarmolik, Vyacheslav N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8304962/
https://www.ncbi.nlm.nih.gov/pubmed/34356435
http://dx.doi.org/10.3390/e23070894