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Transparent Memory Tests Based on the Double Address Sequences
An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and networks on chips, on-board computer applications, net...
Autores principales: | Mrozek, Ireneusz, Yarmolik, Vyacheslav N. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8304962/ https://www.ncbi.nlm.nih.gov/pubmed/34356435 http://dx.doi.org/10.3390/e23070894 |
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