Field-effect at electrical contacts to two-dimensional materials

The inferior electrical contact to two-dimensional (2D) materials is a critical challenge for their application in post-silicon very large-scale integrated circuits. Electrical contacts were generally related to their resistive effect, quantified as contact resistance. With a systematic investigatio...

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Detalles Bibliográficos
Autores principales: Guo, Yao, Sun, Yan, Tang, Alvin, Wang, Ching-Hua, Zhao, Yanqing, Bai, Mengmeng, Xu, Shuting, Xu, Zheqi, Tang, Tao, Wang, Sheng, Qiu, Chenguang, Xu, Kang, Peng, Xubiao, Han, Junfeng, Pop, Eric, Chai, Yang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Tsinghua University Press 2021
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8316888/
https://www.ncbi.nlm.nih.gov/pubmed/34336143
http://dx.doi.org/10.1007/s12274-021-3670-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8316888/
https://www.ncbi.nlm.nih.gov/pubmed/34336143
http://dx.doi.org/10.1007/s12274-021-3670-y

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