RETRACTED ARTICLE: Surface Defect Detection and Recognition Method for Multi-Scale Commutator Based on Deep Transfer Learning

Detalles Bibliográficos
Autores principales: Shu, Yufeng, Li, Bin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Berlin Heidelberg 2021
Materias:
RESEARCH ARTICLE - SPECIAL ISSUE - Frontiers in Parallel Programming Models for Fog and Edge Computing Infrastructures
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8321889/
https://www.ncbi.nlm.nih.gov/pubmed/34345574
http://dx.doi.org/10.1007/s13369-021-05963-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8321889/
https://www.ncbi.nlm.nih.gov/pubmed/34345574
http://dx.doi.org/10.1007/s13369-021-05963-3

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