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RETRACTED ARTICLE: Surface Defect Detection and Recognition Method for Multi-Scale Commutator Based on Deep Transfer Learning
Autores principales: | Shu, Yufeng, Li, Bin |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer Berlin Heidelberg
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8321889/ https://www.ncbi.nlm.nih.gov/pubmed/34345574 http://dx.doi.org/10.1007/s13369-021-05963-3 |
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