Cargando…

Beamcon III, a Linearity Measurement Instrument for Optical Detectors

The design and operation of Beamcon III, the latest linearity measurement instrument using the beam addition method in the detector metrology program at the National Institute of Standards and Technology, is described. The primary improvements in this instrument are the reduction of stray radiation...

Descripción completa

Detalles Bibliográficos
Autores principales: Thompson, Ambler, Chen, How-More
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1994
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8345247/
https://www.ncbi.nlm.nih.gov/pubmed/37404239
http://dx.doi.org/10.6028/jres.099.067