Beamcon III, a Linearity Measurement Instrument for Optical Detectors

The design and operation of Beamcon III, the latest linearity measurement instrument using the beam addition method in the detector metrology program at the National Institute of Standards and Technology, is described. The primary improvements in this instrument are the reduction of stray radiation...

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Detalles Bibliográficos
Autores principales: Thompson, Ambler, Chen, How-More
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1994
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8345247/
https://www.ncbi.nlm.nih.gov/pubmed/37404239
http://dx.doi.org/10.6028/jres.099.067
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author Thompson, Ambler
Chen, How-More
author_facet Thompson, Ambler
Chen, How-More
author_sort Thompson, Ambler
collection PubMed
description The design and operation of Beamcon III, the latest linearity measurement instrument using the beam addition method in the detector metrology program at the National Institute of Standards and Technology, is described. The primary improvements in this instrument are the reduction of stray radiation to extremely low levels by using three well-baffled chambers, a larger dynamic range, and an additional source entrance port. A polynomial response function is determined from the data obtained by this instrument using a least-squares method. The linearity of a silicon photodiode-amplifier detector system was determined to be within 0.054 % (2σ estimate) over nine decades of signal.
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spelling pubmed-83452472023-07-03 Beamcon III, a Linearity Measurement Instrument for Optical Detectors Thompson, Ambler Chen, How-More J Res Natl Inst Stand Technol Article The design and operation of Beamcon III, the latest linearity measurement instrument using the beam addition method in the detector metrology program at the National Institute of Standards and Technology, is described. The primary improvements in this instrument are the reduction of stray radiation to extremely low levels by using three well-baffled chambers, a larger dynamic range, and an additional source entrance port. A polynomial response function is determined from the data obtained by this instrument using a least-squares method. The linearity of a silicon photodiode-amplifier detector system was determined to be within 0.054 % (2σ estimate) over nine decades of signal. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1994 /pmc/articles/PMC8345247/ /pubmed/37404239 http://dx.doi.org/10.6028/jres.099.067 Text en https://creativecommons.org/publicdomain/zero/1.0/The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Thompson, Ambler
Chen, How-More
Beamcon III, a Linearity Measurement Instrument for Optical Detectors
title Beamcon III, a Linearity Measurement Instrument for Optical Detectors
title_full Beamcon III, a Linearity Measurement Instrument for Optical Detectors
title_fullStr Beamcon III, a Linearity Measurement Instrument for Optical Detectors
title_full_unstemmed Beamcon III, a Linearity Measurement Instrument for Optical Detectors
title_short Beamcon III, a Linearity Measurement Instrument for Optical Detectors
title_sort beamcon iii, a linearity measurement instrument for optical detectors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8345247/
https://www.ncbi.nlm.nih.gov/pubmed/37404239
http://dx.doi.org/10.6028/jres.099.067
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