Spectroscopic Analysis of Rare-Earth Silicide Structures on the Si(111) Surface

Two-dimensional rare-earth silicide layers deposited on silicon substrates have been intensively investigated in the last decade, as they can be exploited both as Ohmic contacts or as photodetectors, depending on the substrate doping. In this study, we characterize rare-earth silicide layers on the...

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Detalles Bibliográficos
Autores principales: Sanna, Simone, Plaickner, Julian, Holtgrewe, Kris, Wettig, Vincent M., Speiser, Eugen, Chandola, Sandhya, Esser, Norbert
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8348393/
https://www.ncbi.nlm.nih.gov/pubmed/34361297
http://dx.doi.org/10.3390/ma14154104

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8348393/
https://www.ncbi.nlm.nih.gov/pubmed/34361297
http://dx.doi.org/10.3390/ma14154104

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