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Rapid 2D variable flip angle method for accurate and precise T (1) measurements over a wide range of T (1) values

PURPOSE: To perform dynamic T (1) mapping using a 2D variable flip angle (VFA) method, a correction for the slice profile effect is needed. In this work we investigated the impact of flip angle selection and excitation RF pulse profile on the performance of slice profile correction when applied to T...

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Detalles Bibliográficos
Autores principales: Lena, Beatrice, Bos, Clemens, Ferrer, Cyril J., Moonen, Chrit T. W., Viergever, Max A., Bartels, Lambertus W.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8365751/
https://www.ncbi.nlm.nih.gov/pubmed/34031938
http://dx.doi.org/10.1002/nbm.4542