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Intragranular strain estimation in far-field scanning X-ray diffraction using a Gaussian process
A new method for estimation of intragranular strain fields in polycrystalline materials based on scanning three-dimensional X-ray diffraction (scanning 3DXRD) data is presented and evaluated. Given an a priori known anisotropic compliance, the regression method enforces the balance of linear and ang...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8366424/ https://www.ncbi.nlm.nih.gov/pubmed/34429719 http://dx.doi.org/10.1107/S1600576721005112 |