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Intragranular strain estimation in far-field scanning X-ray diffraction using a Gaussian process

A new method for estimation of intragranular strain fields in polycrystalline materials based on scanning three-dimensional X-ray diffraction (scanning 3DXRD) data is presented and evaluated. Given an a priori known anisotropic compliance, the regression method enforces the balance of linear and ang...

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Detalles Bibliográficos
Autores principales:	Henningsson, Axel, Hendriks, Johannes
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2021
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8366424/ https://www.ncbi.nlm.nih.gov/pubmed/34429719 http://dx.doi.org/10.1107/S1600576721005112

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