A Hybrid Crack Detection Approach for Scanning Electron Microscope Image Using Deep Learning Method

The scanning electron microscope (SEM) is widely used in the analysis and research of materials, including fracture analysis, microstructure morphology, and nanomaterial analysis. With the rapid development of materials science and computer vision technology, the level of detection technology is con...

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Detalles Bibliográficos
Autores principales: Zhao, Lun, Pan, Yunlong, Wang, Sen, Zhang, Liang, Islam, Md Shafiqul
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2021
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8371647/
https://www.ncbi.nlm.nih.gov/pubmed/34471443
http://dx.doi.org/10.1155/2021/5558668

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8371647/
https://www.ncbi.nlm.nih.gov/pubmed/34471443
http://dx.doi.org/10.1155/2021/5558668

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