Mapping the nanoscale effects of charge traps on electrical transport in grain structures of indium tin oxide thin films

We report the mapping of the nanoscale effects of charge trap activities in the grain structures of an oxygen plasma-treated indium tin oxide (ITO) thin film. Here, a conducting Pt probe made direct contact with the surface of an ITO thin film and scanned the surface while measuring the maps of elec...

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Detalles Bibliográficos
Autores principales: Jeon, Hyesong, Kim, Jeongsu, Shekhar, Shashank, Park, Jeehye, Hong, Seunghun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2021
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8386405/
https://www.ncbi.nlm.nih.gov/pubmed/34485820
http://dx.doi.org/10.1039/d1na00175b

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8386405/
https://www.ncbi.nlm.nih.gov/pubmed/34485820
http://dx.doi.org/10.1039/d1na00175b

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