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Mapping the nanoscale effects of charge traps on electrical transport in grain structures of indium tin oxide thin films
We report the mapping of the nanoscale effects of charge trap activities in the grain structures of an oxygen plasma-treated indium tin oxide (ITO) thin film. Here, a conducting Pt probe made direct contact with the surface of an ITO thin film and scanned the surface while measuring the maps of elec...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
RSC
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8386405/ https://www.ncbi.nlm.nih.gov/pubmed/34485820 http://dx.doi.org/10.1039/d1na00175b |