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3D electron-beam writing at sub-15 nm resolution using spider silk as a resist

Electron beam lithography (EBL) is renowned to provide fabrication resolution in the deep nanometer scale. One major limitation of current EBL techniques is their incapability of arbitrary 3d nanofabrication. Resolution, structure integrity and functionalization are among the most important factors....

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Autores principales: Qin, Nan, Qian, Zhi-Gang, Zhou, Chengzhe, Xia, Xiao-Xia, Tao, Tiger H.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8390743/
https://www.ncbi.nlm.nih.gov/pubmed/34446721
http://dx.doi.org/10.1038/s41467-021-25470-1
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author Qin, Nan
Qian, Zhi-Gang
Zhou, Chengzhe
Xia, Xiao-Xia
Tao, Tiger H.
author_facet Qin, Nan
Qian, Zhi-Gang
Zhou, Chengzhe
Xia, Xiao-Xia
Tao, Tiger H.
author_sort Qin, Nan
collection PubMed
description Electron beam lithography (EBL) is renowned to provide fabrication resolution in the deep nanometer scale. One major limitation of current EBL techniques is their incapability of arbitrary 3d nanofabrication. Resolution, structure integrity and functionalization are among the most important factors. Here we report all-aqueous-based, high-fidelity manufacturing of functional, arbitrary 3d nanostructures at a resolution of sub-15 nm using our developed voltage-regulated 3d EBL. Creating arbitrary 3d structures of high resolution and high strength at nanoscale is enabled by genetically engineering recombinant spider silk proteins as the resist. The ability to quantitatively define structural transitions with energetic electrons at different depths within the 3d protein matrix enables polymorphic spider silk proteins to be shaped approaching the molecular level. Furthermore, genetic or mesoscopic modification of spider silk proteins provides the opportunity to embed and stabilize physiochemical and/or biological functions within as-fabricated 3d nanostructures. Our approach empowers the rapid and flexible fabrication of heterogeneously functionalized and hierarchically structured 3d nanocomponents and nanodevices, offering opportunities in biomimetics, therapeutic devices and nanoscale robotics.
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spelling pubmed-83907432021-09-22 3D electron-beam writing at sub-15 nm resolution using spider silk as a resist Qin, Nan Qian, Zhi-Gang Zhou, Chengzhe Xia, Xiao-Xia Tao, Tiger H. Nat Commun Article Electron beam lithography (EBL) is renowned to provide fabrication resolution in the deep nanometer scale. One major limitation of current EBL techniques is their incapability of arbitrary 3d nanofabrication. Resolution, structure integrity and functionalization are among the most important factors. Here we report all-aqueous-based, high-fidelity manufacturing of functional, arbitrary 3d nanostructures at a resolution of sub-15 nm using our developed voltage-regulated 3d EBL. Creating arbitrary 3d structures of high resolution and high strength at nanoscale is enabled by genetically engineering recombinant spider silk proteins as the resist. The ability to quantitatively define structural transitions with energetic electrons at different depths within the 3d protein matrix enables polymorphic spider silk proteins to be shaped approaching the molecular level. Furthermore, genetic or mesoscopic modification of spider silk proteins provides the opportunity to embed and stabilize physiochemical and/or biological functions within as-fabricated 3d nanostructures. Our approach empowers the rapid and flexible fabrication of heterogeneously functionalized and hierarchically structured 3d nanocomponents and nanodevices, offering opportunities in biomimetics, therapeutic devices and nanoscale robotics. Nature Publishing Group UK 2021-08-26 /pmc/articles/PMC8390743/ /pubmed/34446721 http://dx.doi.org/10.1038/s41467-021-25470-1 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Qin, Nan
Qian, Zhi-Gang
Zhou, Chengzhe
Xia, Xiao-Xia
Tao, Tiger H.
3D electron-beam writing at sub-15 nm resolution using spider silk as a resist
title 3D electron-beam writing at sub-15 nm resolution using spider silk as a resist
title_full 3D electron-beam writing at sub-15 nm resolution using spider silk as a resist
title_fullStr 3D electron-beam writing at sub-15 nm resolution using spider silk as a resist
title_full_unstemmed 3D electron-beam writing at sub-15 nm resolution using spider silk as a resist
title_short 3D electron-beam writing at sub-15 nm resolution using spider silk as a resist
title_sort 3d electron-beam writing at sub-15 nm resolution using spider silk as a resist
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8390743/
https://www.ncbi.nlm.nih.gov/pubmed/34446721
http://dx.doi.org/10.1038/s41467-021-25470-1
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