Mechanical and Compositional Implications of Gallium Ion Milling on Epoxy Resin

Focused Ion Beam (FIB) is one of the most common methods for nanodevice fabrication. However, its implications on mechanical properties of polymers have only been speculated. In the current study, we demonstrated flexural bending of FIB-milled epoxy nanobeam, examined in situ under a transmission el...

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Detalles Bibliográficos
Autores principales: Samira, Raz, Vakahi, Atzmon, Eliasy, Rami, Sherman, Dov, Lachman, Noa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8398473/
https://www.ncbi.nlm.nih.gov/pubmed/34451179
http://dx.doi.org/10.3390/polym13162640

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8398473/
https://www.ncbi.nlm.nih.gov/pubmed/34451179
http://dx.doi.org/10.3390/polym13162640

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