Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

Electrical aging in lead zirconate titanate (PbZr(x)Ti(1−x)O(3)) thin films has been intensively studied from a macroscopic perspective. However, structural origins and consequences of such degradation are less documented. In this study, we have used synchrotron radiation to evaluate the behavior of...

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Detalles Bibliográficos
Autores principales: Nguyen, Kien, Bellec, Ewen, Zatterin, Edoardo, Le Rhun, Gwenael, Gergaud, Patrice, Vaxelaire, Nicolas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8399535/
https://www.ncbi.nlm.nih.gov/pubmed/34443022
http://dx.doi.org/10.3390/ma14164500

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8399535/
https://www.ncbi.nlm.nih.gov/pubmed/34443022
http://dx.doi.org/10.3390/ma14164500

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