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Readout Circuits for Capacitive Sensors

The development of microelectromechanical system (MEMS) processes enables the integration of capacitive sensors into silicon integrated circuits. These sensors have been gaining considerable attention as a solution for mobile and internet of things (IoT) devices because of their low power consumptio...

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Detalles Bibliográficos
Autores principales: Yoo, Yongsang, Choi, Byong-Deok
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8400189/
https://www.ncbi.nlm.nih.gov/pubmed/34442582
http://dx.doi.org/10.3390/mi12080960
_version_ 1783745256857010176
author Yoo, Yongsang
Choi, Byong-Deok
author_facet Yoo, Yongsang
Choi, Byong-Deok
author_sort Yoo, Yongsang
collection PubMed
description The development of microelectromechanical system (MEMS) processes enables the integration of capacitive sensors into silicon integrated circuits. These sensors have been gaining considerable attention as a solution for mobile and internet of things (IoT) devices because of their low power consumption. In this study, we introduce the operating principle of representative capacitive sensors and discuss the major technical challenges, solutions, and future tasks for a capacitive readout system. The signal-to-noise ratio (SNR) is the most important performance parameter for a sensor system that measures changes in physical quantities; in addition, power consumption is another important factor because of the characteristics of mobile and IoT devices. Signal power degradation and noise, which degrade the SNR in the sensor readout system, are analyzed; circuit design approaches for degradation prevention are discussed. Further, we discuss the previous efforts and existing studies that focus on low power consumption. We present detailed circuit techniques and illustrate their effectiveness in suppressing signal power degradation and achieving lower noise levels via application to a design example of an actual MEMS microphone readout system.
format Online
Article
Text
id pubmed-8400189
institution National Center for Biotechnology Information
language English
publishDate 2021
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-84001892021-08-29 Readout Circuits for Capacitive Sensors Yoo, Yongsang Choi, Byong-Deok Micromachines (Basel) Review The development of microelectromechanical system (MEMS) processes enables the integration of capacitive sensors into silicon integrated circuits. These sensors have been gaining considerable attention as a solution for mobile and internet of things (IoT) devices because of their low power consumption. In this study, we introduce the operating principle of representative capacitive sensors and discuss the major technical challenges, solutions, and future tasks for a capacitive readout system. The signal-to-noise ratio (SNR) is the most important performance parameter for a sensor system that measures changes in physical quantities; in addition, power consumption is another important factor because of the characteristics of mobile and IoT devices. Signal power degradation and noise, which degrade the SNR in the sensor readout system, are analyzed; circuit design approaches for degradation prevention are discussed. Further, we discuss the previous efforts and existing studies that focus on low power consumption. We present detailed circuit techniques and illustrate their effectiveness in suppressing signal power degradation and achieving lower noise levels via application to a design example of an actual MEMS microphone readout system. MDPI 2021-08-13 /pmc/articles/PMC8400189/ /pubmed/34442582 http://dx.doi.org/10.3390/mi12080960 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Review
Yoo, Yongsang
Choi, Byong-Deok
Readout Circuits for Capacitive Sensors
title Readout Circuits for Capacitive Sensors
title_full Readout Circuits for Capacitive Sensors
title_fullStr Readout Circuits for Capacitive Sensors
title_full_unstemmed Readout Circuits for Capacitive Sensors
title_short Readout Circuits for Capacitive Sensors
title_sort readout circuits for capacitive sensors
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8400189/
https://www.ncbi.nlm.nih.gov/pubmed/34442582
http://dx.doi.org/10.3390/mi12080960
work_keys_str_mv AT yooyongsang readoutcircuitsforcapacitivesensors
AT choibyongdeok readoutcircuitsforcapacitivesensors