An Advanced Noise Reduction and Edge Enhancement Algorithm

Complementary metal-oxide-semiconductor (CMOS) image sensors can cause noise in images collected or transmitted in unfavorable environments, especially low-illumination scenarios. Numerous approaches have been developed to solve the problem of image noise removal. However, producing natural and high...

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Detalles Bibliográficos
Autores principales: Huang, Shih-Chia, Hoang, Quoc-Viet, Le, Trung-Hieu, Peng, Yan-Tsung, Huang, Ching-Chun, Zhang, Cheng, Fung, Benjamin C. M., Cheng, Kai-Han, Huang, Sha-Wo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8400271/
https://www.ncbi.nlm.nih.gov/pubmed/34450832
http://dx.doi.org/10.3390/s21165391

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8400271/
https://www.ncbi.nlm.nih.gov/pubmed/34450832
http://dx.doi.org/10.3390/s21165391

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