Reliability analysis for the fractional-order circuit system subject to the uncertain random fractional-order model with Caputo type()

INTRODUCTION: According to the competing failure theorem, the fractional-order Resistor Capacitance (RC) circuit system suffers not only from internal degradation but also from external shocks. However, due to the general differences of each failure type in the data availability and cognitive uncert...

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Detalles Bibliográficos
Autores principales: Jin, Ting, Gao, Shangce, Xia, Hongxuan, Ding, Hui
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8408334/
https://www.ncbi.nlm.nih.gov/pubmed/34484822
http://dx.doi.org/10.1016/j.jare.2021.04.008

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8408334/
https://www.ncbi.nlm.nih.gov/pubmed/34484822
http://dx.doi.org/10.1016/j.jare.2021.04.008

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