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Reliability analysis for the fractional-order circuit system subject to the uncertain random fractional-order model with Caputo type()
INTRODUCTION: According to the competing failure theorem, the fractional-order Resistor Capacitance (RC) circuit system suffers not only from internal degradation but also from external shocks. However, due to the general differences of each failure type in the data availability and cognitive uncert...
Autores principales: | Jin, Ting, Gao, Shangce, Xia, Hongxuan, Ding, Hui |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8408334/ https://www.ncbi.nlm.nih.gov/pubmed/34484822 http://dx.doi.org/10.1016/j.jare.2021.04.008 |
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