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Prism-based scanning X-ray microscopy
A commentary is provided on a new type of prism deflection scanning X-ray microscope, providing context and some future potential applications of this new type of microscope.
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8420762/ https://www.ncbi.nlm.nih.gov/pubmed/34584731 http://dx.doi.org/10.1107/S2052252521008927 |