Fabrication of on-chip probes for double-tip scanning tunneling microscopy

A reduction of the interprobe distance in multiprobe and double-tip scanning tunneling microscopy to the nanometer scale has been a longstanding and technically difficult challenge. Recent multiprobe systems have allowed for significant progress by achieving distances of ~30 nm using two individuall...

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Detalles Bibliográficos
Autores principales: Leeuwenhoek, Maarten, Groenewoud, Freek, van Oosten, Kees, Benschop, Tjerk, Allan, Milan P., Gröblacher, Simon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8433193/
https://www.ncbi.nlm.nih.gov/pubmed/34567708
http://dx.doi.org/10.1038/s41378-020-00209-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8433193/
https://www.ncbi.nlm.nih.gov/pubmed/34567708
http://dx.doi.org/10.1038/s41378-020-00209-y

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