A Study of Defects in InAs/GaSb Type-II Superlattices Using High-Resolution Reciprocal Space Mapping

In this paper, the study of defects in InAs/GaSb type-II superlattices using high-resolution an x-ray diffraction method as well as scanning (SEM) and transmission (TEM) electron microscopy is presented. The investigated superlattices had 200 (#SL200), 300 (#SL300), and 400 (#SL400) periods and were...

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Detalles Bibliográficos
Autores principales: Sankowska, Iwona, Jasik, Agata, Czuba, Krzysztof, Ratajczak, Jacek, Kozłowski, Paweł, Wzorek, Marek
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8433902/
https://www.ncbi.nlm.nih.gov/pubmed/34501029
http://dx.doi.org/10.3390/ma14174940

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8433902/
https://www.ncbi.nlm.nih.gov/pubmed/34501029
http://dx.doi.org/10.3390/ma14174940

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