Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu[Formula: see text] Mo[Formula: see text] S[Formula: see text] by an advanced electrochemical strain microscopy method

Electrochemical strain microscopy (ESM) has been developed with the aim of measuring Vegard strains in mixed ionic-electronic conductors (MIECs), such as electrode materials for Li-ion batteries, caused by local changes in the chemical composition. In this technique, a voltage-biased AFM tip is used...

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Detalles Bibliográficos
Autores principales: Badur, Sebastian, Renz, Diemo, Cronau, Marvin, Göddenhenrich, Thomas, Dietzel, Dirk, Roling, Bernhard, Schirmeisen, André
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8438055/
https://www.ncbi.nlm.nih.gov/pubmed/34518556
http://dx.doi.org/10.1038/s41598-021-96602-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8438055/
https://www.ncbi.nlm.nih.gov/pubmed/34518556
http://dx.doi.org/10.1038/s41598-021-96602-2

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