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Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu[Formula: see text] Mo[Formula: see text] S[Formula: see text] by an advanced electrochemical strain microscopy method
Electrochemical strain microscopy (ESM) has been developed with the aim of measuring Vegard strains in mixed ionic-electronic conductors (MIECs), such as electrode materials for Li-ion batteries, caused by local changes in the chemical composition. In this technique, a voltage-biased AFM tip is used...
Autores principales: | Badur, Sebastian, Renz, Diemo, Cronau, Marvin, Göddenhenrich, Thomas, Dietzel, Dirk, Roling, Bernhard, Schirmeisen, André |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8438055/ https://www.ncbi.nlm.nih.gov/pubmed/34518556 http://dx.doi.org/10.1038/s41598-021-96602-2 |
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