Sub-diffraction error mapping for localisation microscopy images

Assessing the quality of localisation microscopy images is highly challenging due to the difficulty in reliably detecting errors in experimental data. The most common failure modes are the biases and errors produced by the localisation algorithm when there is emitter overlap. Also known as the high...

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Detalles Bibliográficos
Autores principales: Marsh, Richard J., Costello, Ishan, Gorey, Mark-Alexander, Ma, Donghan, Huang, Fang, Gautel, Mathias, Parsons, Maddy, Cox, Susan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8460687/
https://www.ncbi.nlm.nih.gov/pubmed/34556647
http://dx.doi.org/10.1038/s41467-021-25812-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8460687/
https://www.ncbi.nlm.nih.gov/pubmed/34556647
http://dx.doi.org/10.1038/s41467-021-25812-z

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