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Enhancing the Data Reliability of Multilevel Storage in Phase Change Memory with 2T2R Cell Structure
Multilevel storage and the continuing scaling down of technology have significantly improved the storage density of phase change memory, but have also brought about a challenge, in that data reliability can degrade due to the resistance drift. To ensure data reliability, many read and write operatio...
Autores principales: | Lv, Yi, Wang, Qian, Chen, Houpeng, Xie, Chenchen, Ni, Shenglan, Li, Xi, Song, Zhitang |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8467895/ https://www.ncbi.nlm.nih.gov/pubmed/34577728 http://dx.doi.org/10.3390/mi12091085 |
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