Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering...

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Detalles Bibliográficos
Autores principales: Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S. M., Mikmeková, Eliška Materna
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8471131/
https://www.ncbi.nlm.nih.gov/pubmed/34578750
http://dx.doi.org/10.3390/nano11092435

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8471131/
https://www.ncbi.nlm.nih.gov/pubmed/34578750
http://dx.doi.org/10.3390/nano11092435

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