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Size-induced twinning in InSb semiconductor during room temperature deformation

Room-temperature deformation mechanism of InSb micro-pillars has been investigated via a multi-scale experimental approach, where micro-pillars of 2 µm and 5 µm in diameter were first fabricated by focused ion beam (FIB) milling and in situ deformed in the FIB-SEM by micro-compression using a nano-i...

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Detalles Bibliográficos
Autores principales: Mignerot, Florent, Kedjar, Bouzid, Bahsoun, Hadi, Thilly, Ludovic
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8486849/
https://www.ncbi.nlm.nih.gov/pubmed/34599209
http://dx.doi.org/10.1038/s41598-021-98492-w