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Size-induced twinning in InSb semiconductor during room temperature deformation
Room-temperature deformation mechanism of InSb micro-pillars has been investigated via a multi-scale experimental approach, where micro-pillars of 2 µm and 5 µm in diameter were first fabricated by focused ion beam (FIB) milling and in situ deformed in the FIB-SEM by micro-compression using a nano-i...
Autores principales: | Mignerot, Florent, Kedjar, Bouzid, Bahsoun, Hadi, Thilly, Ludovic |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8486849/ https://www.ncbi.nlm.nih.gov/pubmed/34599209 http://dx.doi.org/10.1038/s41598-021-98492-w |
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