Grazing-incidence X-ray diffraction tomography for characterizing organic thin films

Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure–property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-...

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Detalles Bibliográficos
Autores principales: Tsai, Esther H. R., Xia, Yu, Fukuto, Masafumi, Loo, Yueh-Lin, Li, Ruipeng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8493617/
https://www.ncbi.nlm.nih.gov/pubmed/34667445
http://dx.doi.org/10.1107/S1600576721007184

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8493617/
https://www.ncbi.nlm.nih.gov/pubmed/34667445
http://dx.doi.org/10.1107/S1600576721007184

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