Grazing-incidence X-ray diffraction tomography for characterizing organic thin films

Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure–property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-...

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Autores principales: Tsai, Esther H. R., Xia, Yu, Fukuto, Masafumi, Loo, Yueh-Lin, Li, Ruipeng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8493617/
https://www.ncbi.nlm.nih.gov/pubmed/34667445
http://dx.doi.org/10.1107/S1600576721007184
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author Tsai, Esther H. R.
Xia, Yu
Fukuto, Masafumi
Loo, Yueh-Lin
Li, Ruipeng
author_facet Tsai, Esther H. R.
Xia, Yu
Fukuto, Masafumi
Loo, Yueh-Lin
Li, Ruipeng
author_sort Tsai, Esther H. R.
collection PubMed
description Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure–property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-incidence X-ray scattering and computed tomography to quantitatively determine the dimension and orientation of crystalline domains in thin films without restrictions on the beam coherence, substrate type or film thickness. This computational method extends the capability of synchrotron beamlines by utilizing standard X-ray scattering experiment setups.
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spelling pubmed-84936172021-10-18 Grazing-incidence X-ray diffraction tomography for characterizing organic thin films Tsai, Esther H. R. Xia, Yu Fukuto, Masafumi Loo, Yueh-Lin Li, Ruipeng J Appl Crystallogr Research Papers Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure–property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-incidence X-ray scattering and computed tomography to quantitatively determine the dimension and orientation of crystalline domains in thin films without restrictions on the beam coherence, substrate type or film thickness. This computational method extends the capability of synchrotron beamlines by utilizing standard X-ray scattering experiment setups. International Union of Crystallography 2021-09-04 /pmc/articles/PMC8493617/ /pubmed/34667445 http://dx.doi.org/10.1107/S1600576721007184 Text en © Esther H. R. Tsai et al. 2021 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Tsai, Esther H. R.
Xia, Yu
Fukuto, Masafumi
Loo, Yueh-Lin
Li, Ruipeng
Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
title Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
title_full Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
title_fullStr Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
title_full_unstemmed Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
title_short Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
title_sort grazing-incidence x-ray diffraction tomography for characterizing organic thin films
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8493617/
https://www.ncbi.nlm.nih.gov/pubmed/34667445
http://dx.doi.org/10.1107/S1600576721007184
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