Cargando…
Defocused travelling fringes in a scanning triple-Laue X-ray interferometry setup
The measurement of the silicon lattice parameter by a separate-crystal triple-Laue X-ray interferometer is a key step for the realization of the kilogram by counting atoms. Since the measurement accuracy is approaching nine significant digits, a reliable model of the interferometer operation is requ...
| Autores principales: | , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2021
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8493625/ https://www.ncbi.nlm.nih.gov/pubmed/34667449 http://dx.doi.org/10.1107/S1600576721007962 |