Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network

Insulated Gate Bipolar Transistor (IGBT) is a high-power switch in the field of power electronics. Its reliability is closely related to system stability. Once failure occurs, it may cause irreparable loss. Therefore, potential fault diagnosis methods of IGBT devices are studied in this paper, and t...

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Detalles Bibliográficos
Autores principales: Wu, Jie, Chen, Xiaojuan, Zhang, Zhaohua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2021
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8500739/
https://www.ncbi.nlm.nih.gov/pubmed/34630549
http://dx.doi.org/10.1155/2021/6036118

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8500739/
https://www.ncbi.nlm.nih.gov/pubmed/34630549
http://dx.doi.org/10.1155/2021/6036118

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