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Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode
The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be analyzed a posteriori, modeled, and interpret...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Beilstein-Institut
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8505900/ https://www.ncbi.nlm.nih.gov/pubmed/34703722 http://dx.doi.org/10.3762/bjnano.12.83 |