High-Resolution Mapping of Local Photoluminescence Properties in CuO/Cu(2)O Semiconductor Bi-Layers by Using Synchrotron Radiation

The quality of a semiconductor, which strongly affects its performance, can be estimated by its photoluminescence, which closely relates to the defect and impurity energy levels. In light of this, it is necessary to have a measurement method for photoluminescence properties with spatial resolution a...

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Detalles Bibliográficos
Autores principales: Kobayashi, Masakazu, Izaki, Masanobu, Khoo, Pei Loon, Shinagawa, Tsutomu, Takeuchi, Akihisa, Uesugi, Kentaro
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8509730/
https://www.ncbi.nlm.nih.gov/pubmed/34639967
http://dx.doi.org/10.3390/ma14195570

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8509730/
https://www.ncbi.nlm.nih.gov/pubmed/34639967
http://dx.doi.org/10.3390/ma14195570

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