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High-Resolution Mapping of Local Photoluminescence Properties in CuO/Cu(2)O Semiconductor Bi-Layers by Using Synchrotron Radiation
The quality of a semiconductor, which strongly affects its performance, can be estimated by its photoluminescence, which closely relates to the defect and impurity energy levels. In light of this, it is necessary to have a measurement method for photoluminescence properties with spatial resolution a...
Autores principales: | Kobayashi, Masakazu, Izaki, Masanobu, Khoo, Pei Loon, Shinagawa, Tsutomu, Takeuchi, Akihisa, Uesugi, Kentaro |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8509730/ https://www.ncbi.nlm.nih.gov/pubmed/34639967 http://dx.doi.org/10.3390/ma14195570 |
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