“May the Force Be with You!” Force–Volume Mapping with Atomic Force Microscopy

[Image: see text] Information of the chemical, mechanical, and electrical properties of materials can be obtained using force volume mapping (FVM), a measurement mode of scanning probe microscopy (SPM). Protocols have been developed with FVM for a broad range of materials, including polymers, organi...

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Detalles Bibliográficos
Autores principales: Olubowale, Olajumoke H., Biswas, Shanta, Azom, Golam, Prather, Benjamin L., Owoso, Samuel D., Rinee, Khaleda C., Marroquin, Karen, Gates, Kaelin A., Chambers, Matthew B., Xu, Amy, Garno, Jayne C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2021
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8515370/
https://www.ncbi.nlm.nih.gov/pubmed/34660949
http://dx.doi.org/10.1021/acsomega.1c03829

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8515370/
https://www.ncbi.nlm.nih.gov/pubmed/34660949
http://dx.doi.org/10.1021/acsomega.1c03829

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