Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band

Mm-wave dielectric waveguides are a promising and low-cost technology for the transmission of ultra-high data rates. Besides the attenuation (losses) and group delay, the bending loss of the dielectric waveguides is also one of the key parameters to establish the capacity and energy efficiency of su...

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Detalles Bibliográficos
Autores principales: Vu, Thanh-Luan, Barlerin, Stéphane, Stricot, Yves, Sauleau, Ronan, Ettorre, Mauro, González-Ovejero, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8526621/
https://www.ncbi.nlm.nih.gov/pubmed/34667206
http://dx.doi.org/10.1038/s41598-021-00187-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8526621/
https://www.ncbi.nlm.nih.gov/pubmed/34667206
http://dx.doi.org/10.1038/s41598-021-00187-9

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