Temperature Impacts on Endurance and Read Disturbs in Charge-Trap 3D NAND Flash Memories

Temperature effects should be well considered when designing flash-based memory systems, because they are a fundamental factor that affect both the performance and the reliability of NAND flash memories. In this work, aiming to comprehensively understanding the temperature effects on 3D NAND flash m...

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Detalles Bibliográficos
Autores principales: Chen, Fei, Chen, Bo, Lin, Hongzhe, Kong, Yachen, Liu, Xin, Zhan, Xuepeng, Chen, Jiezhi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8538043/
https://www.ncbi.nlm.nih.gov/pubmed/34683203
http://dx.doi.org/10.3390/mi12101152

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8538043/
https://www.ncbi.nlm.nih.gov/pubmed/34683203
http://dx.doi.org/10.3390/mi12101152

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