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Temperature Impacts on Endurance and Read Disturbs in Charge-Trap 3D NAND Flash Memories
Temperature effects should be well considered when designing flash-based memory systems, because they are a fundamental factor that affect both the performance and the reliability of NAND flash memories. In this work, aiming to comprehensively understanding the temperature effects on 3D NAND flash m...
Autores principales: | Chen, Fei, Chen, Bo, Lin, Hongzhe, Kong, Yachen, Liu, Xin, Zhan, Xuepeng, Chen, Jiezhi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8538043/ https://www.ncbi.nlm.nih.gov/pubmed/34683203 http://dx.doi.org/10.3390/mi12101152 |
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