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Monitored Tomographic Reconstruction—An Advanced Tool to Study the 3D Morphology of Nanomaterials

Detailed and accurate three-dimensional (3D) information about the morphology of hierarchically structured materials is derived from multi-scale X-ray computed tomography (XCT) and subsequent 3D data reconstruction. High-resolution X-ray microscopy and nano-XCT are suitable techniques to nondestruct...

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Detalles Bibliográficos
Autores principales: Bulatov, Konstantin, Chukalina, Marina, Kutukova, Kristina, Kohan, Vlad, Ingacheva, Anastasia, Buzmakov, Alexey, Arlazarov, Vladimir V., Zschech, Ehrenfried
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8538887/
https://www.ncbi.nlm.nih.gov/pubmed/34684965
http://dx.doi.org/10.3390/nano11102524